Order Article Reprints

Tuan TTA, Kuo D-H, Cao PT, Nguyen VS, Pham Q-P, Nghi VK, Tran NPL. Electrical Characterization of RF Reactive Sputtered p–Mg-In_xGa_1−xN/n–Si Hetero-Junction Diodes without Using Buffer Layer. Coatings. 2019; 9(11):699. https://doi.org/10.3390/coatings9110699

Tuan, Thi Tran Anh, Dong-Hau Kuo, Phuong Thao Cao, Van Sau Nguyen, Quoc-Phong Pham, Vinh Khanh Nghi, and Nguyen Phuong Lan Tran. 2019. "Electrical Characterization of RF Reactive Sputtered p–Mg-In_xGa_1−xN/n–Si Hetero-Junction Diodes without Using Buffer Layer" Coatings 9, no. 11: 699. https://doi.org/10.3390/coatings9110699

Tuan, T. T. A., Kuo, D.-H., Cao, P. T., Nguyen, V. S., Pham, Q.-P., Nghi, V. K., & Tran, N. P. L. (2019). Electrical Characterization of RF Reactive Sputtered p–Mg-In_xGa_1−xN/n–Si Hetero-Junction Diodes without Using Buffer Layer. Coatings, 9(11), 699. https://doi.org/10.3390/coatings9110699