Improvement of Thin Film Adhesion Due to Bombardment by Fast Argon Atoms
AbstractA new hollow cathode sputtering system is used for beam-assisted deposition of thin films on dielectric substrates. A copper target placed at the hollow cathode bottom is uniformly sputtered by argon ions from the glow discharge plasma filling the cathode. Through an emissive grid, sputtered copper atoms leave the cathode together with accelerated argon ions. On their way to the substrate, the ions—due to charge exchange collisions—turn into fast argon atoms bombarding the growing film. With increasing argon ion energy, continuous bombardment results in the film adhesion improvement and reduction of the deposition rate down to zero, at an energy of about 2 keV. The pulsed bombardment does not influence the film deposition rate, and results in a monotonic growth of the film adhesion up to 20 MPa when increasing the fast atom energy up to 10 keV. View Full-Text
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Grigoriev, S.; Metel, A.; Volosova, M.; Melnik, Y. Improvement of Thin Film Adhesion Due to Bombardment by Fast Argon Atoms. Coatings 2018, 8, 303.
Grigoriev S, Metel A, Volosova M, Melnik Y. Improvement of Thin Film Adhesion Due to Bombardment by Fast Argon Atoms. Coatings. 2018; 8(9):303.Chicago/Turabian Style
Grigoriev, Sergey; Metel, Alexander; Volosova, Marina; Melnik, Yury. 2018. "Improvement of Thin Film Adhesion Due to Bombardment by Fast Argon Atoms." Coatings 8, no. 9: 303.
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