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Journal: Coatings, 2024
Volume: 14
Number: 555

Article: Effects of Annealing Temperature on Bias Temperature Stress Stabilities of Bottom-Gate Coplanar In-Ga-Zn-O Thin-Film Transistors
Authors: by Yuyun Chen, Yi Shen, Yuanming Chen, Guodong Xu, Yudong Liu and Rui Huang
Link: https://www.mdpi.com/2079-6412/14/5/555

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