Xiao, Y.;                     Da, X.;                     Cao, H.;                     Xiong, K.;                     Li, G.;                     Tang, M.    
        Modeling of Ionizing Radiation Effects for Negative Capacitance Field-Effect Transistors. Coatings 2023, 13, 798.
    https://doi.org/10.3390/coatings13040798
    AMA Style
    
                                Xiao Y,                                 Da X,                                 Cao H,                                 Xiong K,                                 Li G,                                 Tang M.        
                Modeling of Ionizing Radiation Effects for Negative Capacitance Field-Effect Transistors. Coatings. 2023; 13(4):798.
        https://doi.org/10.3390/coatings13040798
    
    Chicago/Turabian Style
    
                                Xiao, Yongguang,                                 Xianghua Da,                                 Haize Cao,                                 Ke Xiong,                                 Gang Li,                                 and Minghua Tang.        
                2023. "Modeling of Ionizing Radiation Effects for Negative Capacitance Field-Effect Transistors" Coatings 13, no. 4: 798.
        https://doi.org/10.3390/coatings13040798
    
    APA Style
    
                                Xiao, Y.,                                 Da, X.,                                 Cao, H.,                                 Xiong, K.,                                 Li, G.,                                 & Tang, M.        
        
        (2023). Modeling of Ionizing Radiation Effects for Negative Capacitance Field-Effect Transistors. Coatings, 13(4), 798.
        https://doi.org/10.3390/coatings13040798