Xiao, Y.; Da, X.; Cao, H.; Xiong, K.; Li, G.; Tang, M.
Modeling of Ionizing Radiation Effects for Negative Capacitance Field-Effect Transistors. Coatings 2023, 13, 798.
https://doi.org/10.3390/coatings13040798
AMA Style
Xiao Y, Da X, Cao H, Xiong K, Li G, Tang M.
Modeling of Ionizing Radiation Effects for Negative Capacitance Field-Effect Transistors. Coatings. 2023; 13(4):798.
https://doi.org/10.3390/coatings13040798
Chicago/Turabian Style
Xiao, Yongguang, Xianghua Da, Haize Cao, Ke Xiong, Gang Li, and Minghua Tang.
2023. "Modeling of Ionizing Radiation Effects for Negative Capacitance Field-Effect Transistors" Coatings 13, no. 4: 798.
https://doi.org/10.3390/coatings13040798
APA Style
Xiao, Y., Da, X., Cao, H., Xiong, K., Li, G., & Tang, M.
(2023). Modeling of Ionizing Radiation Effects for Negative Capacitance Field-Effect Transistors. Coatings, 13(4), 798.
https://doi.org/10.3390/coatings13040798