Fern, C.-L.; Liu, W.-J.; Chang, Y.-H.; Chiang, C.-C.; Lai, J.-X.; Chen, Y.-T.; Chen, W.-G.; Wu, T.-H.; Lin, S.-H.; Lin, K.-W.
Studying the Crucial Physical Characteristics Related to Surface Roughness and Magnetic Domain Structure in CoFeSm Thin Films. Coatings 2023, 13, 1961.
https://doi.org/10.3390/coatings13111961
AMA Style
Fern C-L, Liu W-J, Chang Y-H, Chiang C-C, Lai J-X, Chen Y-T, Chen W-G, Wu T-H, Lin S-H, Lin K-W.
Studying the Crucial Physical Characteristics Related to Surface Roughness and Magnetic Domain Structure in CoFeSm Thin Films. Coatings. 2023; 13(11):1961.
https://doi.org/10.3390/coatings13111961
Chicago/Turabian Style
Fern, Chi-Lon, Wen-Jen Liu, Yung-Huang Chang, Chia-Chin Chiang, Jian-Xin Lai, Yuan-Tsung Chen, Wei-Guan Chen, Te-Ho Wu, Shih-Hung Lin, and Ko-Wei Lin.
2023. "Studying the Crucial Physical Characteristics Related to Surface Roughness and Magnetic Domain Structure in CoFeSm Thin Films" Coatings 13, no. 11: 1961.
https://doi.org/10.3390/coatings13111961
APA Style
Fern, C.-L., Liu, W.-J., Chang, Y.-H., Chiang, C.-C., Lai, J.-X., Chen, Y.-T., Chen, W.-G., Wu, T.-H., Lin, S.-H., & Lin, K.-W.
(2023). Studying the Crucial Physical Characteristics Related to Surface Roughness and Magnetic Domain Structure in CoFeSm Thin Films. Coatings, 13(11), 1961.
https://doi.org/10.3390/coatings13111961
