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Journal: Coatings, 2020
Volume: 10
Number: 330

Article: Local Structure Analysis on Si-Containing DLC Films Based on the Measurement of C K-Edge and Si K-Edge X-ray Absorption Spectra
Authors: by Kazuhiro Kanda, Shuto Suzuki, Masahito Niibe, Takayuki Hasegawa, Tsuneo Suzuki and Hedetoshi Saitoh
Link: https://www.mdpi.com/2079-6412/10/4/330

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