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Correction to Coatings 2020, 10(7), 620.
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Correction

Correction: Zhou et al. Effect of Zirconium Doping on Electrical Properties of Aluminum Oxide Dielectric Layer by Spin Coating Method with Low Temperature Preparation. Coatings 2020, 10, 620

by
Yue Zhou
1,
Zhihao Liang
1,
Rihui Yao
1,*,
Wencai Zuo
1,
Shangxiong Zhou
1,
Zhennan Zhu
1,
Yiping Wang
2,
Tian Qiu
3,
Honglong Ning
1,* and
Junbiao Peng
1
1
State Key Laboratory of Luminescent Materials and Devices, Institute of Polymer Optoelectronic Materials and Devices, South China University of Technology, Guangzhou 510641, China
2
State Key Laboratory of Mechanical Structural Mechanics and Control, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China
3
Faculty of Intelligent Manufacturing, Wuyi University, Jiangmen 529000, China
*
Authors to whom correspondence should be addressed.
Coatings 2020, 10(10), 918; https://doi.org/10.3390/coatings10100918
Submission received: 16 October 2020 / Accepted: 21 October 2020 / Published: 21 October 2020
Browse Figures
Versions Notes
The authors wish to make the following corrections to this paper [1]:
While this manuscript was in preparation, there are some data processing errors leading to some drawing mistakes. Replace:
Coatings 10 00918 g001 550
Figure 2. X-ray diffraction (XRD) spectra of Zr–AlOx films with different Zr concentrations: (a) annealing at 150 °C, (b) annealing at 200 °C, and (c) annealing at 250 °C.
Figure 2. X-ray diffraction (XRD) spectra of Zr–AlOx films with different Zr concentrations: (a) annealing at 150 °C, (b) annealing at 200 °C, and (c) annealing at 250 °C.
Coatings 10 00918 g001
with
Coatings 10 00918 g002 550
Figure 2. X-ray diffraction (XRD) spectra of Zr–AlOx films with different Zr concentrations: (a) annealing at 150 °C, (b) annealing at 200 °C, and (c) annealing at 250 °C.
Figure 2. X-ray diffraction (XRD) spectra of Zr–AlOx films with different Zr concentrations: (a) annealing at 150 °C, (b) annealing at 200 °C, and (c) annealing at 250 °C.
Coatings 10 00918 g002
The authors would like to apologize for any inconvenience caused to the readers by these changes.

Reference

  1. Zhou, Y.; Liang, Z.; Yao, R.; Zuo, W.; Zhou, S.; Zhu, Z.; Wang, Y.; Qiu, T.; Ning, H.; Peng, J. Effect of Zirconium Doping on Electrical Properties of Aluminum Oxide Dielectric Layer by Spin Coating Method with Low Temperature Preparation. Coatings 2020, 10, 620. [Google Scholar] [CrossRef]
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MDPI and ACS Style

Zhou, Y.; Liang, Z.; Yao, R.; Zuo, W.; Zhou, S.; Zhu, Z.; Wang, Y.; Qiu, T.; Ning, H.; Peng, J. Correction: Zhou et al. Effect of Zirconium Doping on Electrical Properties of Aluminum Oxide Dielectric Layer by Spin Coating Method with Low Temperature Preparation. Coatings 2020, 10, 620. Coatings 2020, 10, 918. https://doi.org/10.3390/coatings10100918

AMA Style

Zhou Y, Liang Z, Yao R, Zuo W, Zhou S, Zhu Z, Wang Y, Qiu T, Ning H, Peng J. Correction: Zhou et al. Effect of Zirconium Doping on Electrical Properties of Aluminum Oxide Dielectric Layer by Spin Coating Method with Low Temperature Preparation. Coatings 2020, 10, 620. Coatings. 2020; 10(10):918. https://doi.org/10.3390/coatings10100918

Chicago/Turabian Style

Zhou, Yue, Zhihao Liang, Rihui Yao, Wencai Zuo, Shangxiong Zhou, Zhennan Zhu, Yiping Wang, Tian Qiu, Honglong Ning, and Junbiao Peng. 2020. "Correction: Zhou et al. Effect of Zirconium Doping on Electrical Properties of Aluminum Oxide Dielectric Layer by Spin Coating Method with Low Temperature Preparation. Coatings 2020, 10, 620" Coatings 10, no. 10: 918. https://doi.org/10.3390/coatings10100918

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