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Journal: Nanomaterials, 2019
Volume: 9
Number: 967

Article: Effect of Electron Irradiation Fluence on InP-Based High Electron Mobility Transistors
Authors: by Shuxiang Sun, Peng Ding, Zhi Jin, Yinghui Zhong, Yuxiao Li and Zhichao Wei
Link: https://www.mdpi.com/2079-4991/9/7/967

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