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Journal: Nanomaterials, 2018
Volume: 8
Number: 293
Article:
Effect of Source/Drain Electrodes on the Electrical Properties of Silicon–Tin Oxide Thin-Film Transistors
Authors:
by
Xianzhe Liu, Honglong Ning, Weifeng Chen, Zhiqiang Fang, Rihui Yao, Xiaofeng Wang, Yuxi Deng, Weijian Yuan, Weijing Wu and Junbiao Peng
Link:
https://www.mdpi.com/2079-4991/8/5/293
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