Order Article Reprints

Liu X, Ning H, Chen W, Fang Z, Yao R, Wang X, Deng Y, Yuan W, Wu W, Peng J. Effect of Source/Drain Electrodes on the Electrical Properties of Silicon–Tin Oxide Thin-Film Transistors. Nanomaterials. 2018; 8(5):293. https://doi.org/10.3390/nano8050293

Liu, Xianzhe, Honglong Ning, Weifeng Chen, Zhiqiang Fang, Rihui Yao, Xiaofeng Wang, Yuxi Deng, Weijian Yuan, Weijing Wu, and Junbiao Peng. 2018. "Effect of Source/Drain Electrodes on the Electrical Properties of Silicon–Tin Oxide Thin-Film Transistors" Nanomaterials 8, no. 5: 293. https://doi.org/10.3390/nano8050293

Liu, X., Ning, H., Chen, W., Fang, Z., Yao, R., Wang, X., Deng, Y., Yuan, W., Wu, W., & Peng, J. (2018). Effect of Source/Drain Electrodes on the Electrical Properties of Silicon–Tin Oxide Thin-Film Transistors. Nanomaterials, 8(5), 293. https://doi.org/10.3390/nano8050293