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Journal: Nanomaterials, 2017
Volume: 7
Number: 385
Article:
Data Retention Characterization of Gate-Injected Gold-Nanoparticle Non-Volatile Memory with Low-Damage CF4-Plasma-Treated Blocking Oxide Layer
Authors:
by
Yu-Hua Liu, Chyuan-Haur Kao, Tsung-Chin Cheng, Chih-I Wu and Jer-Chyi Wang
Link:
https://www.mdpi.com/2079-4991/7/11/385
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