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Journal: NanomaterialsVolume: 7Number: 385
Article: Data Retention Characterization of Gate-Injected Gold-Nanoparticle Non-Volatile Memory with Low-Damage CF4-Plasma-Treated Blocking Oxide Layer
- Authors:
- Yu-Hua Liu1,†,
- Chyuan-Haur Kao1,2,3,† and
- Tsung-Chin Cheng4
- et al.
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