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Journal: Nanomaterials, 2025
Volume: 15
Number: 282
282
Article: A Review of Measurement and Characterization of Film Layers of Perovskite Solar Cells by Spectroscopic Ellipsometry
Authors: by Liyuan Ma, Xipeng Xu, Changcai Cui, Tukun Li, Shan Lou, Paul J. Scott, Xiangqian Jiang and Wenhan Zeng
Link: https://www.mdpi.com/2079-4991/15/4/282

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