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Journal: Nanomaterials, 2023
Volume: 13
Number: 898
Article:
Mechanisms of the Device Property Alteration Generated by the Proton Irradiation in GaN-Based MIS-HEMTs Using Extremely Thin Gate Insulator
Authors:
by
Sung-Jae Chang, Dong-Seok Kim, Tae-Woo Kim, Youngho Bae, Hyun-Wook Jung, Il-Gyu Choi, Youn-Sub Noh, Sang-Heung Lee, Seong-Il Kim, Ho-Kyun Ahn, Dong-Min Kang and Jong-Won Lim
Link:
https://www.mdpi.com/2079-4991/13/5/898
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