Staeck, S.; Andrle, A.; Hönicke, P.; Baumann, J.; Grötzsch, D.; Weser, J.; Goetzke, G.; Jonas, A.; Kayser, Y.; Förste, F.;
et al. Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples. Nanomaterials 2022, 12, 3766.
https://doi.org/10.3390/nano12213766
AMA Style
Staeck S, Andrle A, Hönicke P, Baumann J, Grötzsch D, Weser J, Goetzke G, Jonas A, Kayser Y, Förste F,
et al. Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples. Nanomaterials. 2022; 12(21):3766.
https://doi.org/10.3390/nano12213766
Chicago/Turabian Style
Staeck, Steffen, Anna Andrle, Philipp Hönicke, Jonas Baumann, Daniel Grötzsch, Jan Weser, Gesa Goetzke, Adrian Jonas, Yves Kayser, Frank Förste,
and et al. 2022. "Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples" Nanomaterials 12, no. 21: 3766.
https://doi.org/10.3390/nano12213766
APA Style
Staeck, S., Andrle, A., Hönicke, P., Baumann, J., Grötzsch, D., Weser, J., Goetzke, G., Jonas, A., Kayser, Y., Förste, F., Mantouvalou, I., Viefhaus, J., Soltwisch, V., Stiel, H., Beckhoff, B., & Kanngießer, B.
(2022). Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples. Nanomaterials, 12(21), 3766.
https://doi.org/10.3390/nano12213766
