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- Peverini, F.
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- Peverini, F.
- Bizzarri, M.
- Boscardin, M.
- Calcagnile, L.
- Caprai, M.
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- Large, M.
- Maruccio, G.
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- Pallotta, S.
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- Quarta, G.
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- Rossi, G.
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- Boscardin, M.
- Calcagnile, L.
- Caprai, M.
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- Crivellari, M.
- Cuttone, G.
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- Pallotta, S.
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- Quarta, G.
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- Scorzoni, A.
- Soncini, C.
- Servoli, L.
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- Talamonti, C.
- Verzellesi, G.
- Wyrsch, N.
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Journal: Nanomaterials, 2022
Volume: 12
Number: 3466
3466
Article:
High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices
Authors:
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Francesca Peverini, Marco Bizzarri, Maurizio Boscardin, Lucio Calcagnile, Mirco Caprai, Anna Paola Caricato, Giuseppe Antonio Pablo Cirrone, Michele Crivellari, Giacomo Cuttone, Sylvain Dunand, Livio Fanò, Benedetta Gianfelici, Omar Hammad, Maria Ionica, Keida Kanxheri, Matthew Large, Giuseppe Maruccio, Mauro Menichelli, Anna Grazia Monteduro, Francesco Moscatelli, Arianna Morozzi, Stefania Pallotta, Andrea Papi, Daniele Passeri, Marco Petasecca, Giada Petringa, Igor Pis, Gianluca Quarta, Silvia Rizzato, Alessandro Rossi, Giulia Rossi, Andrea Scorzoni, Cristian Soncini, Leonello Servoli, Silvia Tacchi, Cinzia Talamonti, Giovanni Verzellesi, Nicolas Wyrsch, Nicola Zema and Maddalena Pedioadd
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Cite
Peverini, F.; Bizzarri, M.; Boscardin, M.; Calcagnile, L.; Caprai, M.; Caricato, A.P.; Cirrone, G.A.P.; Crivellari, M.; Cuttone, G.; Dunand, S.; et al. High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices. Nanomaterials 2022, 12, 3466. https://doi.org/10.3390/nano12193466
Peverini F, Bizzarri M, Boscardin M, Calcagnile L, Caprai M, Caricato AP, Cirrone GAP, Crivellari M, Cuttone G, Dunand S, et al. High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices. Nanomaterials. 2022; 12(19):3466. https://doi.org/10.3390/nano12193466
Chicago/Turabian StylePeverini, Francesca, Marco Bizzarri, Maurizio Boscardin, Lucio Calcagnile, Mirco Caprai, Anna Paola Caricato, Giuseppe Antonio Pablo Cirrone, Michele Crivellari, Giacomo Cuttone, Sylvain Dunand, and et al. 2022. "High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices" Nanomaterials 12, no. 19: 3466. https://doi.org/10.3390/nano12193466
APA StylePeverini, F., Bizzarri, M., Boscardin, M., Calcagnile, L., Caprai, M., Caricato, A. P., Cirrone, G. A. P., Crivellari, M., Cuttone, G., Dunand, S., Fanò, L., Gianfelici, B., Hammad, O., Ionica, M., Kanxheri, K., Large, M., Maruccio, G., Menichelli, M., Monteduro, A. G., ... Pedio, M. (2022). High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices. Nanomaterials, 12(19), 3466. https://doi.org/10.3390/nano12193466
