Article Versions Notes

DeRose PC, Benkstein KD, Elsheikh EB, Gaigalas AK, Lehman SE, Ripple DC, Tian L, Vreeland WN, Welch EJ, York AW, et al. Number Concentration Measurements of Polystyrene Submicrometer Particles. Nanomaterials. 2022; 12(18):3118. https://doi.org/10.3390/nano12183118

DeRose, Paul C., Kurt D. Benkstein, Elzafir B. Elsheikh, Adolfas K. Gaigalas, Sean E. Lehman, Dean C. Ripple, Linhua Tian, Wyatt N. Vreeland, Eric J. Welch, Adam W. York, and et al. 2022. "Number Concentration Measurements of Polystyrene Submicrometer Particles" Nanomaterials 12, no. 18: 3118. https://doi.org/10.3390/nano12183118

DeRose, P. C., Benkstein, K. D., Elsheikh, E. B., Gaigalas, A. K., Lehman, S. E., Ripple, D. C., Tian, L., Vreeland, W. N., Welch, E. J., York, A. W., Zhang, Y.-Z., & Wang, L. (2022). Number Concentration Measurements of Polystyrene Submicrometer Particles. Nanomaterials, 12(18), 3118. https://doi.org/10.3390/nano12183118