Number Concentration Measurements of Polystyrene Submicrometer Particles
Abstract
:1. Introduction
2. Materials and Methods
2.1. Transmission Electron Microscopy (TEM) and Dynamic Light Scattering (DLS)—Particle Sizing
2.2. Dry Mass (DM)—Number Concentration
2.3. Flow Cytometry (FCM)
2.3.1. Submicrometer Particle Concentration Measurement Using TruCount (TC) Microspheres as an Internal Counting Standard
2.3.2. Particle Concentrations Measured Volumetrically
2.3.3. Submicrometer Sphere Size Distribution—Mie Scattering Calculation
2.4. Fluorescence Microscopy (FM)—Number Concentration
2.5. Particle Tracking Analysis (PTA)
2.6. Microfluidic Resistive Pulse Sensing (MRPS)
2.7. Particle Asymmetric Flow Field Flow Fractionation–Multi-Angle Light Scattering (AF4-MALS)
2.8. Reengineered Non-Sorting Analytical Flow Cytometer—Virus Counter (VC)
3. Results
3.1. Number Concentration
3.2. Diameter
4. Discussion
4.1. Number Concentration
4.2. Diameter
5. Conclusions
Supplementary Materials
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
NIST Disclaimer
References
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Technique | 100 nm Sphere | 200 nm Sphere | 500 nm Sphere | |||
---|---|---|---|---|---|---|
Size nm | Concentration mL−1 | Size nm | Concentration mL−1 | Size nm | Concentration mL−1 | |
TEM and DM | 107 ± 14 | (4.0 ± 1.6) × 109 | 189 ± 24 | (1.0 ± 0.4) × 109 | 492 ± 58 | (2.5 ± 0.9) × 109 |
FCM | 105 ± 14 | (4.4 ± 0.3) × 109 TruCount standard | 186 ± 20 | (0.90 ± 0.06) × 109 TruCount standard | 498 ± 28 | (2.6 ± 0.2) × 109 TruCount standard |
(3.9 ± 0.3) × 109 Volumetric | (0.88 ± 0.06) × 109 Volumetric | (2.5 ± 0.2) × 109 Volumetric | ||||
FM | N/A | (3.8 ± 0.3) × 109 | N/A | (0.8 ± 0.2) × 109 | N/A | (2.7 ± 0.2) × 109 |
PTA | 106 ± 4 | (2.7 ± 0.6) × 109 | 175 ± 4 | (0.8 ± 0.2) × 109 | 433 ± 16 | (1.6 ± 0.4) × 109 |
MRPS | 113 ± 16 | (2.3 ± 0.3) × 109 | 172 ± 20 | (0.7 ± 0.1) × 109 | 419 ± 20 | (2.3 ± 0.3) × 109 |
AF4-MALS | 87 ± 8 | (7.2 ± 0.2) × 109 | ||||
VC | N/A | (1.0 ± 0.2) × 109 | N/A | (2.4 ± 0.3) × 109 |
Component | Type | d = 100 nm | d = 200 nm | d = 500 nm |
---|---|---|---|---|
(a) | ||||
Repeatability | A | 1.0% | 1.0% | 1.0% |
TruCount number concentration | B | 3.0% | 3.0% | 3.0% |
Gate choice | B | 1.0% | 1.0% | 1.0% |
Background counts | B | 1.0% | 1.0% | 1.0% |
Combined rel. standard uncertainty | 3.5% | 3.5% | 3.5% | |
(b) | ||||
Repeatability | A | 1.0% | 1.0% | 1.0% |
Volume determination | B | 1.0% | 1.0% | 1.0% |
Gate choice | B | 1.0% | 1.0% | 1.0% |
Background counts | B | 1.0% | 1.0% | 1.0% |
Other counting errors | B | 2.5% | 2.5% | 2.5% |
Combined rel. standard uncertainty | 3.2% | 3.2% | 3.2% | |
(c) | ||||
Repeatability | A | 3.3% | 12.6% | 2.9% |
Sample cell height | B | 1.3% | 1.3% | 1.3% |
Pixel size | B | 0.2% | 0.2% | 0.2% |
Background counts | B | 0.7% | 0.7% | 0.7% |
Combined rel. standard uncertainty | 3.6% | 12.7% | 3.3% | |
(d) | ||||
Diameter repeatability | A | 0.3% | 0.2% | 0.3% |
Diameter accuracy | B | 6.5% | 6.3% | 5.9% |
Particle segmentation | B | 0.2% | 0.2% | 0.2% |
Combined rel. standard uncertainty | 6.5% | 6.3% | 5.9% | |
(e) | ||||
Propagated diameter uncertainty | B | 20.0% | 19.0% | 18.0% |
Mass repeatability | A | 0.5% | 1.1% | 0.4% |
Mass accuracy | B | 1.4% | 0.4% | 0.7% |
Combined rel. standard uncertainty | 20.1% | 19.0% | 18.0% |
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DeRose, P.C.; Benkstein, K.D.; Elsheikh, E.B.; Gaigalas, A.K.; Lehman, S.E.; Ripple, D.C.; Tian, L.; Vreeland, W.N.; Welch, E.J.; York, A.W.; et al. Number Concentration Measurements of Polystyrene Submicrometer Particles. Nanomaterials 2022, 12, 3118. https://doi.org/10.3390/nano12183118
DeRose PC, Benkstein KD, Elsheikh EB, Gaigalas AK, Lehman SE, Ripple DC, Tian L, Vreeland WN, Welch EJ, York AW, et al. Number Concentration Measurements of Polystyrene Submicrometer Particles. Nanomaterials. 2022; 12(18):3118. https://doi.org/10.3390/nano12183118
Chicago/Turabian StyleDeRose, Paul C., Kurt D. Benkstein, Elzafir B. Elsheikh, Adolfas K. Gaigalas, Sean E. Lehman, Dean C. Ripple, Linhua Tian, Wyatt N. Vreeland, Eric J. Welch, Adam W. York, and et al. 2022. "Number Concentration Measurements of Polystyrene Submicrometer Particles" Nanomaterials 12, no. 18: 3118. https://doi.org/10.3390/nano12183118