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Journal: Nanomaterials, 2020
Volume: 10
Number: 1782
Article:
Impact of Photo-Excitation on Leakage Current and Negative Bias Instability in InSnZnO Thickness-Varied Thin-Film Transistors
Authors:
by
Dapeng Wang, Mamoru Furuta, Shigekazu Tomai and Koki Yano
Link:
https://www.mdpi.com/2079-4991/10/9/1782
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