Yuan, H.; Shi, Y.; Li, L.; Ling, G.; Zeng, J.; Wang, Z.
Fault Diagnosis in Analog Circuits Using a Multi-Input Convolutional Neural Network with Feature Attention. Computation 2025, 13, 94.
https://doi.org/10.3390/computation13040094
AMA Style
Yuan H, Shi Y, Li L, Ling G, Zeng J, Wang Z.
Fault Diagnosis in Analog Circuits Using a Multi-Input Convolutional Neural Network with Feature Attention. Computation. 2025; 13(4):94.
https://doi.org/10.3390/computation13040094
Chicago/Turabian Style
Yuan, Hui, Yaoke Shi, Long Li, Guobi Ling, Jingxiao Zeng, and Zhiwen Wang.
2025. "Fault Diagnosis in Analog Circuits Using a Multi-Input Convolutional Neural Network with Feature Attention" Computation 13, no. 4: 94.
https://doi.org/10.3390/computation13040094
APA Style
Yuan, H., Shi, Y., Li, L., Ling, G., Zeng, J., & Wang, Z.
(2025). Fault Diagnosis in Analog Circuits Using a Multi-Input Convolutional Neural Network with Feature Attention. Computation, 13(4), 94.
https://doi.org/10.3390/computation13040094