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Journal: Information, 2024
Volume: 15
Number: 206
Article:
Insulator Defect Detection Based on YOLOv8s-SwinT
Authors:
by
Zhendong He, Wenbin Yang, Yanjie Liu, Anping Zheng, Jie Liu, Taishan Lou and Jie Zhang
Link:
https://www.mdpi.com/2078-2489/15/4/206
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