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Journal: Agriculture, 2025
Volume: 15
Number: 1649
Article:
The RF–Absolute Gradient Method for Localizing Wheat Moisture Content’s Abnormal Regions with 2D Microwave Scanning Detection
Authors:
by
Dong Dai, Zhenyu Wang, Hao Huang, Xu Mao, Yehong Liu, Hao Li and Du Chen
Link:
https://www.mdpi.com/2077-0472/15/15/1649
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