Semyalo, D.; Kim, Y.; Omia, E.; Arief, M.A.A.; Kim, H.; Sim, E.-Y.; Kim, M.S.; Baek, I.; Cho, B.-K.
Nondestructive Identification of Internal Potato Defects Using Visible and Short-Wavelength Near-Infrared Spectral Analysis. Agriculture 2024, 14, 2014.
https://doi.org/10.3390/agriculture14112014
AMA Style
Semyalo D, Kim Y, Omia E, Arief MAA, Kim H, Sim E-Y, Kim MS, Baek I, Cho B-K.
Nondestructive Identification of Internal Potato Defects Using Visible and Short-Wavelength Near-Infrared Spectral Analysis. Agriculture. 2024; 14(11):2014.
https://doi.org/10.3390/agriculture14112014
Chicago/Turabian Style
Semyalo, Dennis, Yena Kim, Emmanuel Omia, Muhammad Akbar Andi Arief, Haeun Kim, Eun-Yeong Sim, Moon S. Kim, Insuck Baek, and Byoung-Kwan Cho.
2024. "Nondestructive Identification of Internal Potato Defects Using Visible and Short-Wavelength Near-Infrared Spectral Analysis" Agriculture 14, no. 11: 2014.
https://doi.org/10.3390/agriculture14112014
APA Style
Semyalo, D., Kim, Y., Omia, E., Arief, M. A. A., Kim, H., Sim, E.-Y., Kim, M. S., Baek, I., & Cho, B.-K.
(2024). Nondestructive Identification of Internal Potato Defects Using Visible and Short-Wavelength Near-Infrared Spectral Analysis. Agriculture, 14(11), 2014.
https://doi.org/10.3390/agriculture14112014
