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Ishiguchi H, Yoshiga Y, Shimizu A, Ueyama T, Ono M, Fukuda M, Kato T, Fujii S, Hisaoka M, Uchida T, et al. The Differential Prognostic Impact of Long-Duration Atrial High-Rate Episodes Detected by Cardiac Implantable Electronic Devices between Patients with and without a History of Atrial Fibrillation. Journal of Clinical Medicine. 2022; 11(6):1732. https://doi.org/10.3390/jcm11061732

Ishiguchi, Hironori, Yasuhiro Yoshiga, Akihiko Shimizu, Takeshi Ueyama, Makoto Ono, Masakazu Fukuda, Takayoshi Kato, Shohei Fujii, Masahiro Hisaoka, Tomoyuki Uchida, and et al. 2022. "The Differential Prognostic Impact of Long-Duration Atrial High-Rate Episodes Detected by Cardiac Implantable Electronic Devices between Patients with and without a History of Atrial Fibrillation" Journal of Clinical Medicine 11, no. 6: 1732. https://doi.org/10.3390/jcm11061732

Ishiguchi, H., Yoshiga, Y., Shimizu, A., Ueyama, T., Ono, M., Fukuda, M., Kato, T., Fujii, S., Hisaoka, M., Uchida, T., Omuro, T., Okamura, T., Kobayashi, S., & Yano, M. (2022). The Differential Prognostic Impact of Long-Duration Atrial High-Rate Episodes Detected by Cardiac Implantable Electronic Devices between Patients with and without a History of Atrial Fibrillation. Journal of Clinical Medicine, 11(6), 1732. https://doi.org/10.3390/jcm11061732