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Journal: Appl. Sci., 2019
Volume: 9
Number: 613
Article:
A Stochastic Deterioration Process Based Approach for Micro Switches Remaining Useful Life Estimation
Authors:
by
Bangcheng Zhang, Yubo Shao, Zhenchen Chang, Zhongbo Sun and Yuankun Sui
Link:
https://www.mdpi.com/2076-3417/9/3/613
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