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Journal: Appl. Sci., 2019
Volume: 9
Number: 613

Article: A Stochastic Deterioration Process Based Approach for Micro Switches Remaining Useful Life Estimation
Authors: by Bangcheng Zhang, Yubo Shao, Zhenchen Chang, Zhongbo Sun and Yuankun Sui
Link: https://www.mdpi.com/2076-3417/9/3/613

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