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Journal: Appl. Sci., 2019
Volume: 9
Number: 597

Article: Bin2Vec: A Better Wafer Bin Map Coloring Scheme for Comprehensible Visualization and Effective Bad Wafer Classification
Authors: by Junhong Kim, Hyungseok Kim, Jaesun Park, Kyounghyun Mo and Pilsung Kang
Link: https://www.mdpi.com/2076-3417/9/3/597

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