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Journal: Appl. Sci., 2019
Volume: 9
Number: 4253

Article: Space Charge Accumulation and Decay in Dielectric Materials with Dual Discrete Traps
Authors: by Zhaoliang Xing, Chong Zhang, Haozhe Cui, Yali Hai, Qingzhou Wu and Daomin Min
Link: https://www.mdpi.com/2076-3417/9/20/4253

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