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Journal: Appl. Sci., 2018
Volume: 8
Number: 424
Article:
Temperature-Dependent Electrical Properties of Al2O3-Passivated Multilayer MoS2 Thin-Film Transistors
Authors:
by
Seok Hwan Jeong, Na Liu, Heekyeong Park, Young Ki Hong and Sunkook Kim
Link:
https://www.mdpi.com/2076-3417/8/3/424
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