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Journal: Appl. Sci., 2018
Volume: 8
Number: 424

Article: Temperature-Dependent Electrical Properties of Al2O3-Passivated Multilayer MoS2 Thin-Film Transistors
Authors: by Seok Hwan Jeong, Na Liu, Heekyeong Park, Young Ki Hong and Sunkook Kim
Link: https://www.mdpi.com/2076-3417/8/3/424

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