Qu, Y.; Peng, R.; Hao, J.; Pan, H.; Niu, J.; Jiang, J.
Influence of Illumination Polarization and Target Structure on Measurement Sensitivity of Through-Focus Scanning Optical Microscopy. Appl. Sci. 2018, 8, 1819.
https://doi.org/10.3390/app8101819
AMA Style
Qu Y, Peng R, Hao J, Pan H, Niu J, Jiang J.
Influence of Illumination Polarization and Target Structure on Measurement Sensitivity of Through-Focus Scanning Optical Microscopy. Applied Sciences. 2018; 8(10):1819.
https://doi.org/10.3390/app8101819
Chicago/Turabian Style
Qu, Yufu, Renju Peng, Jialin Hao, Hui Pan, Jiebin Niu, and Jie Jiang.
2018. "Influence of Illumination Polarization and Target Structure on Measurement Sensitivity of Through-Focus Scanning Optical Microscopy" Applied Sciences 8, no. 10: 1819.
https://doi.org/10.3390/app8101819
APA Style
Qu, Y., Peng, R., Hao, J., Pan, H., Niu, J., & Jiang, J.
(2018). Influence of Illumination Polarization and Target Structure on Measurement Sensitivity of Through-Focus Scanning Optical Microscopy. Applied Sciences, 8(10), 1819.
https://doi.org/10.3390/app8101819