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Journal: Appl. Sci., 2025
Volume: 15
Number: 4356
Article:
Reliability Prediction of Mixed-Signal Module Based on Multi-Stress Field Failure Mechanisms
Authors:
by
Wei Zheng, Mingtao Feng, Ruishi Lin, Yue Yu, Kaiwen Xiao and Guofu Zhai
Link:
https://www.mdpi.com/2076-3417/15/8/4356
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