Salas-RodrÃguez, S.; González-Moreno, F.I.; Woo-GarcÃa, R.M.; Herrera-May, A.L.; López-Huerta, F.; Caballero-Briones, F.
Defect Tailoring in HfO2/Si Films upon Post-Deposition Annealing and Ultraviolet Irradiation. Appl. Sci. 2025, 15, 1573.
https://doi.org/10.3390/app15031573
AMA Style
Salas-RodrÃguez S, González-Moreno FI, Woo-GarcÃa RM, Herrera-May AL, López-Huerta F, Caballero-Briones F.
Defect Tailoring in HfO2/Si Films upon Post-Deposition Annealing and Ultraviolet Irradiation. Applied Sciences. 2025; 15(3):1573.
https://doi.org/10.3390/app15031573
Chicago/Turabian Style
Salas-RodrÃguez, Silvestre, Fernanda I. González-Moreno, Rosa M. Woo-GarcÃa, AgustÃn L. Herrera-May, Francisco López-Huerta, and Felipe Caballero-Briones.
2025. "Defect Tailoring in HfO2/Si Films upon Post-Deposition Annealing and Ultraviolet Irradiation" Applied Sciences 15, no. 3: 1573.
https://doi.org/10.3390/app15031573
APA Style
Salas-RodrÃguez, S., González-Moreno, F. I., Woo-GarcÃa, R. M., Herrera-May, A. L., López-Huerta, F., & Caballero-Briones, F.
(2025). Defect Tailoring in HfO2/Si Films upon Post-Deposition Annealing and Ultraviolet Irradiation. Applied Sciences, 15(3), 1573.
https://doi.org/10.3390/app15031573
