Next Article in Journal
Sex and Age Disparities in Water Polo-Related Skills
Previous Article in Journal
Lung Sound Classification Model for On-Device AI
 
 
Font Type:
Arial Georgia Verdana
Font Size:
Aa Aa Aa
Line Spacing:
Column Width:
Background:
This is an early access version, the complete PDF, HTML, and XML versions will be available soon.
Article

EIM-YOLO: A Defect Detection Method for Metal-Painted Surfaces on Electrical Sealing Covers

1
School of Mechanical and Energy Engineering, Zhejiang University of Science and Technology, Hangzhou 310023, China
2
Zhejiang Southwest Research Institute, Zhejiang University of Science and Technology, Jinyun 321404, China
*
Author to whom correspondence should be addressed.
Appl. Sci. 2025, 15(17), 9380; https://doi.org/10.3390/app15179380 (registering DOI)
Submission received: 20 May 2025 / Revised: 13 August 2025 / Accepted: 23 August 2025 / Published: 26 August 2025

Abstract

Electrical sealing covers are widely used in various industrial equipment, where the quality of their metal-painted surfaces directly affects product appearance and long-term reliability. Micro-defects such as pores, particles, scratches, and uneven paint coatings can compromise protective performance during manufacturing. In the rapidly growing new energy vehicle (NEV) industry, battery charging-port sealing covers are critical components, requiring precise defect detection due to exposure to harsh environments, like extreme weather and dust-laden conditions. Even minor defects can lead to water ingress or foreign matter accumulation, affecting vehicle performance and user safety. Conventional manual or rule-based inspection methods are inefficient, and the existing deep learning models struggle with detecting minor and subtle defects. To address these challenges, this study proposes EIM-YOLO, an improved object detection framework for the automated detection of metal-painted surface defects on electrical sealing covers. We propose a novel lightweight convolutional module named C3PUltraConv, which reduces model parameters by 3.1% while improving mAP50 by 1% and recall by 3.2%. The backbone integrates RFAConv for enhanced feature perception, and the neck architecture uses an optimized BiFPN-concat structure with adaptive weight learning for better multi-scale feature fusion. Experimental validation on a real-world industrial dataset collected using industrial cameras shows that EIM-YOLO achieves a precision of 71% (an improvement of 3.4%), with mAP50 reaching 64.8% (a growth of 2.6%), and mAP50–95 improving by 1.2%. Maintaining real-time detection capability, EIM-YOLO significantly outperforms the existing baseline models, offering a more accurate solution for automated quality control in NEV manufacturing.
Keywords: defect detection; NEV charging-port sealing; YOLOv11n model; EIM-YOLO model; C3PUltraConv module; InnerIoU loss function defect detection; NEV charging-port sealing; YOLOv11n model; EIM-YOLO model; C3PUltraConv module; InnerIoU loss function

Share and Cite

MDPI and ACS Style

Wu, Z.; Yang, L. EIM-YOLO: A Defect Detection Method for Metal-Painted Surfaces on Electrical Sealing Covers. Appl. Sci. 2025, 15, 9380. https://doi.org/10.3390/app15179380

AMA Style

Wu Z, Yang L. EIM-YOLO: A Defect Detection Method for Metal-Painted Surfaces on Electrical Sealing Covers. Applied Sciences. 2025; 15(17):9380. https://doi.org/10.3390/app15179380

Chicago/Turabian Style

Wu, Zhanjun, and Likang Yang. 2025. "EIM-YOLO: A Defect Detection Method for Metal-Painted Surfaces on Electrical Sealing Covers" Applied Sciences 15, no. 17: 9380. https://doi.org/10.3390/app15179380

APA Style

Wu, Z., & Yang, L. (2025). EIM-YOLO: A Defect Detection Method for Metal-Painted Surfaces on Electrical Sealing Covers. Applied Sciences, 15(17), 9380. https://doi.org/10.3390/app15179380

Note that from the first issue of 2016, this journal uses article numbers instead of page numbers. See further details here.

Article Metrics

Back to TopTop