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Open AccessArticle
EIM-YOLO: A Defect Detection Method for Metal-Painted Surfaces on Electrical Sealing Covers
by
Zhanjun Wu
Zhanjun Wu 1,2 and
Likang Yang
Likang Yang 1,2,*
1
School of Mechanical and Energy Engineering, Zhejiang University of Science and Technology, Hangzhou 310023, China
2
Zhejiang Southwest Research Institute, Zhejiang University of Science and Technology, Jinyun 321404, China
*
Author to whom correspondence should be addressed.
Appl. Sci. 2025, 15(17), 9380; https://doi.org/10.3390/app15179380 (registering DOI)
Submission received: 20 May 2025
/
Revised: 13 August 2025
/
Accepted: 23 August 2025
/
Published: 26 August 2025
Abstract
Electrical sealing covers are widely used in various industrial equipment, where the quality of their metal-painted surfaces directly affects product appearance and long-term reliability. Micro-defects such as pores, particles, scratches, and uneven paint coatings can compromise protective performance during manufacturing. In the rapidly growing new energy vehicle (NEV) industry, battery charging-port sealing covers are critical components, requiring precise defect detection due to exposure to harsh environments, like extreme weather and dust-laden conditions. Even minor defects can lead to water ingress or foreign matter accumulation, affecting vehicle performance and user safety. Conventional manual or rule-based inspection methods are inefficient, and the existing deep learning models struggle with detecting minor and subtle defects. To address these challenges, this study proposes EIM-YOLO, an improved object detection framework for the automated detection of metal-painted surface defects on electrical sealing covers. We propose a novel lightweight convolutional module named C3PUltraConv, which reduces model parameters by 3.1% while improving mAP50 by 1% and recall by 3.2%. The backbone integrates RFAConv for enhanced feature perception, and the neck architecture uses an optimized BiFPN-concat structure with adaptive weight learning for better multi-scale feature fusion. Experimental validation on a real-world industrial dataset collected using industrial cameras shows that EIM-YOLO achieves a precision of 71% (an improvement of 3.4%), with mAP50 reaching 64.8% (a growth of 2.6%), and mAP50–95 improving by 1.2%. Maintaining real-time detection capability, EIM-YOLO significantly outperforms the existing baseline models, offering a more accurate solution for automated quality control in NEV manufacturing.
Share and Cite
MDPI and ACS Style
Wu, Z.; Yang, L.
EIM-YOLO: A Defect Detection Method for Metal-Painted Surfaces on Electrical Sealing Covers. Appl. Sci. 2025, 15, 9380.
https://doi.org/10.3390/app15179380
AMA Style
Wu Z, Yang L.
EIM-YOLO: A Defect Detection Method for Metal-Painted Surfaces on Electrical Sealing Covers. Applied Sciences. 2025; 15(17):9380.
https://doi.org/10.3390/app15179380
Chicago/Turabian Style
Wu, Zhanjun, and Likang Yang.
2025. "EIM-YOLO: A Defect Detection Method for Metal-Painted Surfaces on Electrical Sealing Covers" Applied Sciences 15, no. 17: 9380.
https://doi.org/10.3390/app15179380
APA Style
Wu, Z., & Yang, L.
(2025). EIM-YOLO: A Defect Detection Method for Metal-Painted Surfaces on Electrical Sealing Covers. Applied Sciences, 15(17), 9380.
https://doi.org/10.3390/app15179380
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