Article Versions Notes

Laksman J, Dietrich F, Maltezopoulos T, Liu J, Ferreira de Lima DE, Gerasimova N, Karpics I, Kujala N, Schmidt P, Karabekyan S, et al. Operation of Photo Electron Spectrometers for Non-Invasive Photon Diagnostics at the European X-Ray Free Electron Laser. Applied Sciences. 2024; 14(22):10152. https://doi.org/10.3390/app142210152

Laksman, Joakim, Florian Dietrich, Theophilos Maltezopoulos, Jia Liu, Danilo Enoque Ferreira de Lima, Natalia Gerasimova, Ivars Karpics, Naresh Kujala, Philipp Schmidt, Suren Karabekyan, and et al. 2024. "Operation of Photo Electron Spectrometers for Non-Invasive Photon Diagnostics at the European X-Ray Free Electron Laser" Applied Sciences 14, no. 22: 10152. https://doi.org/10.3390/app142210152

Laksman, J., Dietrich, F., Maltezopoulos, T., Liu, J., Ferreira de Lima, D. E., Gerasimova, N., Karpics, I., Kujala, N., Schmidt, P., Karabekyan, S., Serkez, S., & Grünert, J. (2024). Operation of Photo Electron Spectrometers for Non-Invasive Photon Diagnostics at the European X-Ray Free Electron Laser. Applied Sciences, 14(22), 10152. https://doi.org/10.3390/app142210152