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Journal: Appl. Sci., 2024
Volume: 14
Number: 8785
Article:
The Photoionization Processes of Deep Trap Levels in n-GaN Films Grown by MOVPE Technique on Ammono-GaN Substrates
Authors:
by
Piotr Kruszewski, Konrad Sakowski, Krzysztof Gościński and Paweł Prystawko
Link:
https://www.mdpi.com/2076-3417/14/19/8785
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