Méndez, M.M.; Quintana, J.A.R.; Jardón, E.L.R.; Nandayapa, M.; Vergara Villegas, O.O.
Fourier Features and Machine Learning for Contour Profile Inspection in CNC Milling Parts: A Novel Intelligent Inspection Method (NIIM). Appl. Sci. 2024, 14, 8144.
https://doi.org/10.3390/app14188144
AMA Style
Méndez MM, Quintana JAR, Jardón ELR, Nandayapa M, Vergara Villegas OO.
Fourier Features and Machine Learning for Contour Profile Inspection in CNC Milling Parts: A Novel Intelligent Inspection Method (NIIM). Applied Sciences. 2024; 14(18):8144.
https://doi.org/10.3390/app14188144
Chicago/Turabian Style
Méndez, Manuel Meraz, Juan A. RamÃrez Quintana, Elva Lilia Reynoso Jardón, Manuel Nandayapa, and Osslan Osiris Vergara Villegas.
2024. "Fourier Features and Machine Learning for Contour Profile Inspection in CNC Milling Parts: A Novel Intelligent Inspection Method (NIIM)" Applied Sciences 14, no. 18: 8144.
https://doi.org/10.3390/app14188144
APA Style
Méndez, M. M., Quintana, J. A. R., Jardón, E. L. R., Nandayapa, M., & Vergara Villegas, O. O.
(2024). Fourier Features and Machine Learning for Contour Profile Inspection in CNC Milling Parts: A Novel Intelligent Inspection Method (NIIM). Applied Sciences, 14(18), 8144.
https://doi.org/10.3390/app14188144