Order Article Reprints

Duan Y, Xue K, Sun H, Bao H, Wei Y, You Z, Zhang Y, Jiang X, Yang S, Chen J, et al. LogEDL: Log Anomaly Detection via Evidential Deep Learning. Applied Sciences. 2024; 14(16):7055. https://doi.org/10.3390/app14167055

Duan, Yunfeng, Kaiwen Xue, Hao Sun, Haotong Bao, Yadong Wei, Zhangzheng You, Yuantian Zhang, Xiwei Jiang, Sangning Yang, Jiaxing Chen, and et al. 2024. "LogEDL: Log Anomaly Detection via Evidential Deep Learning" Applied Sciences 14, no. 16: 7055. https://doi.org/10.3390/app14167055

Duan, Y., Xue, K., Sun, H., Bao, H., Wei, Y., You, Z., Zhang, Y., Jiang, X., Yang, S., Chen, J., Duan, B., & Ou, Z. (2024). LogEDL: Log Anomaly Detection via Evidential Deep Learning. Applied Sciences, 14(16), 7055. https://doi.org/10.3390/app14167055