Liu, X.; Jiao, L.; Peng, Y.; An, K.; Wang, D.; Lu, W.; Han, J.
Few-Shot Steel Defect Detection Based on a Fine-Tuned Network with Serial Multi-Scale Attention. Appl. Sci. 2024, 14, 5823.
https://doi.org/10.3390/app14135823
AMA Style
Liu X, Jiao L, Peng Y, An K, Wang D, Lu W, Han J.
Few-Shot Steel Defect Detection Based on a Fine-Tuned Network with Serial Multi-Scale Attention. Applied Sciences. 2024; 14(13):5823.
https://doi.org/10.3390/app14135823
Chicago/Turabian Style
Liu, Xiangpeng, Lei Jiao, Yulin Peng, Kang An, Danning Wang, Wei Lu, and Jianjiao Han.
2024. "Few-Shot Steel Defect Detection Based on a Fine-Tuned Network with Serial Multi-Scale Attention" Applied Sciences 14, no. 13: 5823.
https://doi.org/10.3390/app14135823
APA Style
Liu, X., Jiao, L., Peng, Y., An, K., Wang, D., Lu, W., & Han, J.
(2024). Few-Shot Steel Defect Detection Based on a Fine-Tuned Network with Serial Multi-Scale Attention. Applied Sciences, 14(13), 5823.
https://doi.org/10.3390/app14135823