Billat, V.; Berthomier, C.; Clémençon, M.; Brandewinder, M.; Essid, S.; Damon, C.; Rigaud, F.; Bénichoux, A.; Maby, E.; Fornoni, L.;
et al. Electroencephalography Response during an Incremental Test According to the V̇O2max Plateau Incidence. Appl. Sci. 2024, 14, 5411.
https://doi.org/10.3390/app14135411
AMA Style
Billat V, Berthomier C, Clémençon M, Brandewinder M, Essid S, Damon C, Rigaud F, Bénichoux A, Maby E, Fornoni L,
et al. Electroencephalography Response during an Incremental Test According to the V̇O2max Plateau Incidence. Applied Sciences. 2024; 14(13):5411.
https://doi.org/10.3390/app14135411
Chicago/Turabian Style
Billat, Véronique, Christian Berthomier, Michel Clémençon, Marie Brandewinder, Slim Essid, Cécilia Damon, François Rigaud, Alexis Bénichoux, Emmanuel Maby, Lesly Fornoni,
and et al. 2024. "Electroencephalography Response during an Incremental Test According to the V̇O2max Plateau Incidence" Applied Sciences 14, no. 13: 5411.
https://doi.org/10.3390/app14135411
APA Style
Billat, V., Berthomier, C., Clémençon, M., Brandewinder, M., Essid, S., Damon, C., Rigaud, F., Bénichoux, A., Maby, E., Fornoni, L., Bouchet, P., Van Beers, P., Massot, B., Revol, P., Poinsard, L., Creveaux, T., Collet, C., Mattout, J., & Pialoux, V.
(2024). Electroencephalography Response during an Incremental Test According to the V̇O2max Plateau Incidence. Applied Sciences, 14(13), 5411.
https://doi.org/10.3390/app14135411