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Journal: Appl. Sci., 2024
Volume: 14
Number: 4381
4381
Article: X-ray Line-Intensity Ratios in Neon-like Xenon: Significantly Reducing the Discrepancy between Measurements and Simulations
Authors: by Shihan Huang, Zhiming Tang, Yang Yang, Hongming Zhang, Ziqiang Tian, Shaokun Ma, Jinyu Li, Chao Zeng, Huajian Ji, Ke Yao and Yaming Zou
Link: https://www.mdpi.com/2076-3417/14/11/4381

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