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Journal: Appl. Sci., 2023
Volume: 13
Number: 4284

Article: Cu(In,Ga)Se2:Te Thin Films for Stoichiometric Compensation by Using Co-Sputtering and Rapid Thermal Annealing
Authors: by Sakal Pech, Yun Ju Rou, Sara Kim, Kang-Yeon Lee and Nam-Hoon Kim
Link: https://www.mdpi.com/2076-3417/13/7/4284

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