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        Journal: Appl. Sci., 2023
        Volume: 13 
                	Number: 4284 
                
        
        Article:
        Cu(In,Ga)Se2:Te Thin Films for Stoichiometric Compensation by Using Co-Sputtering and Rapid Thermal Annealing 
        Authors: 
       	by
                    Sakal Pech, Yun Ju Rou, Sara Kim, Kang-Yeon Lee and Nam-Hoon Kim        
        Link:
        https://www.mdpi.com/2076-3417/13/7/4284
        
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