Hong, X.; Guan, S.-U.; Xue, N.; Li, Z.; Man, K.L.; Wong, P.W.H.; Liu, D.
Dual-Track Lifelong Machine Learning-Based Fine-Grained Product Quality Analysis. Appl. Sci. 2023, 13, 1241.
https://doi.org/10.3390/app13031241
AMA Style
Hong X, Guan S-U, Xue N, Li Z, Man KL, Wong PWH, Liu D.
Dual-Track Lifelong Machine Learning-Based Fine-Grained Product Quality Analysis. Applied Sciences. 2023; 13(3):1241.
https://doi.org/10.3390/app13031241
Chicago/Turabian Style
Hong, Xianbin, Sheng-Uei Guan, Nian Xue, Zhen Li, Ka Lok Man, Prudence W. H. Wong, and Dawei Liu.
2023. "Dual-Track Lifelong Machine Learning-Based Fine-Grained Product Quality Analysis" Applied Sciences 13, no. 3: 1241.
https://doi.org/10.3390/app13031241
APA Style
Hong, X., Guan, S.-U., Xue, N., Li, Z., Man, K. L., Wong, P. W. H., & Liu, D.
(2023). Dual-Track Lifelong Machine Learning-Based Fine-Grained Product Quality Analysis. Applied Sciences, 13(3), 1241.
https://doi.org/10.3390/app13031241