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Brief Report

Response Time of a Thin-Film Resistance Temperature Detector (RTD) for High-Intensity Focused Ultrasound (HIFU) Phantom Applications

1
Safety Measurement Institute, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Republic of Korea
2
Department of Applied Measurement Science, University of Science and Technology (UST), Daejeon 34113, Republic of Korea
3
Photometry and Radiometry Group, Division of Physical Metrology, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Republic of Korea
*
Authors to whom correspondence should be addressed.
Appl. Sci. 2023, 13(10), 6220; https://doi.org/10.3390/app13106220
Submission received: 9 February 2023 / Revised: 8 May 2023 / Accepted: 16 May 2023 / Published: 19 May 2023
(This article belongs to the Section Mechanical Engineering)

Featured Application

The thin-film RTD array sensor quickly detects a sudden thermal change inside a tissue-mimicking material (TMM) to validate high-intensity focused ultrasound (HIFU) devices.

Abstract

The thermal response time of a thin-film resistance temperature detector (RTD) array sensor was measured for a high-intensity focused ultrasound (HIFU) phantom. As the temperature inside materials change rapidly within several seconds, it is important to have a temperature sensor with a fast response time to evaluate their performance. However, previous methods for measuring thermal response time were not suitable for thin-film sensors, and there were no quantitative data available. In this study, we used a liquid drop method to measure the thermal time constant of the thin-film RTD, which was found to be 1.0 ± 0.2 ms. This indicates that the thin-film RTD array sensor has a sufficiently fast response time to detect sudden temperature changes inside the tissue-mimicking material (TMM) for validating HIFU devices.
Keywords: HIFU; thin-film RTD array; response time; liquid drop method; phantom HIFU; thin-film RTD array; response time; liquid drop method; phantom

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MDPI and ACS Style

Lequiron, M.S.G.B.; Joe, D.J.; Lim, S.D.; Doh, I. Response Time of a Thin-Film Resistance Temperature Detector (RTD) for High-Intensity Focused Ultrasound (HIFU) Phantom Applications. Appl. Sci. 2023, 13, 6220. https://doi.org/10.3390/app13106220

AMA Style

Lequiron MSGB, Joe DJ, Lim SD, Doh I. Response Time of a Thin-Film Resistance Temperature Detector (RTD) for High-Intensity Focused Ultrasound (HIFU) Phantom Applications. Applied Sciences. 2023; 13(10):6220. https://doi.org/10.3390/app13106220

Chicago/Turabian Style

Lequiron, Ma. Stella Grace B., Daniel J. Joe, Sun Do Lim, and Il Doh. 2023. "Response Time of a Thin-Film Resistance Temperature Detector (RTD) for High-Intensity Focused Ultrasound (HIFU) Phantom Applications" Applied Sciences 13, no. 10: 6220. https://doi.org/10.3390/app13106220

APA Style

Lequiron, M. S. G. B., Joe, D. J., Lim, S. D., & Doh, I. (2023). Response Time of a Thin-Film Resistance Temperature Detector (RTD) for High-Intensity Focused Ultrasound (HIFU) Phantom Applications. Applied Sciences, 13(10), 6220. https://doi.org/10.3390/app13106220

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