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Journal: Appl. Sci., 2023
Volume: 13
Number: 6131
Article:
Combined Influence of Gate Oxide and Back Oxide Materials on Self-Heating and DIBL Effect in 2D MOS2-Based MOSFETs
Authors:
by
Atabek E. Atamuratov, Khushnudbek Sh. Saparov, Ahmed Yusupov and Jean Chamberlain Chedjou
Link:
https://www.mdpi.com/2076-3417/13/10/6131
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