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Journal: Appl. Sci., 2022
Volume: 12
Number: 4679

Article: Improved U-Net++ with Patch Split for Micro-Defect Inspection in Silk Screen Printing
Authors: by Byungguan Yoon, Homin Lee and Jongpil Jeong
Link: https://www.mdpi.com/2076-3417/12/9/4679

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