Biswas, S.; Gerchow, L.; Luetkens, H.; Prokscha, T.; Antognini, A.; Berger, N.; Cocolios, T.E.; Dressler, R.; Indelicato, P.; Jungmann, K.;
et al. Characterization of a Continuous Muon Source for the Non-Destructive and Depth-Selective Elemental Composition Analysis by Muon Induced X- and Gamma-rays. Appl. Sci. 2022, 12, 2541.
https://doi.org/10.3390/app12052541
AMA Style
Biswas S, Gerchow L, Luetkens H, Prokscha T, Antognini A, Berger N, Cocolios TE, Dressler R, Indelicato P, Jungmann K,
et al. Characterization of a Continuous Muon Source for the Non-Destructive and Depth-Selective Elemental Composition Analysis by Muon Induced X- and Gamma-rays. Applied Sciences. 2022; 12(5):2541.
https://doi.org/10.3390/app12052541
Chicago/Turabian Style
Biswas, Sayani, Lars Gerchow, Hubertus Luetkens, Thomas Prokscha, Aldo Antognini, Niklaus Berger, Thomas Elias Cocolios, Rugard Dressler, Paul Indelicato, Klaus Jungmann,
and et al. 2022. "Characterization of a Continuous Muon Source for the Non-Destructive and Depth-Selective Elemental Composition Analysis by Muon Induced X- and Gamma-rays" Applied Sciences 12, no. 5: 2541.
https://doi.org/10.3390/app12052541
APA Style
Biswas, S., Gerchow, L., Luetkens, H., Prokscha, T., Antognini, A., Berger, N., Cocolios, T. E., Dressler, R., Indelicato, P., Jungmann, K., Kirch, K., Knecht, A., Papa, A., Pohl, R., Pospelov, M., Rapisarda, E., Reiter, P., Ritjoho, N., Roccia, S.,
... Amato, A.
(2022). Characterization of a Continuous Muon Source for the Non-Destructive and Depth-Selective Elemental Composition Analysis by Muon Induced X- and Gamma-rays. Applied Sciences, 12(5), 2541.
https://doi.org/10.3390/app12052541
