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Journal: Appl. Sci., 2022
Volume: 12
Number: 2005

Article: Defect Recognition of Roll-to-Roll Printed Conductors Using Dark Lock-in Thermography and Localized Segmentation
Authors: by Haitao Zheng, Linghao Zhou, Ryan Marks, Tuomas Happonen and Thomas M. Kraft
Link: https://www.mdpi.com/2076-3417/12/4/2005

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