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Journal: Appl. Sci., 2022
Volume: 12
Number: 1675

Article: A Novel Fault Diagnosis Method for Analog Circuits Based on Multi-Input Deep Residual Networks with an Improved Empirical Wavelet Transform
Authors: by Zhen Liu, Xuemei Liu, Songlin Xie, Junhai Wang and Xiuyun Zhou
Link: https://www.mdpi.com/2076-3417/12/3/1675

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