Li, S.; Zhang, H.; Liu, Z.; Xu, J.; Fan, G.; Li, W.; Li, Q.; Hu, X.; Jing, G.
Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) Profiling of Self Assembled Monolayer (SAM) Patterns Based on Vapor Deposition Technique. Appl. Sci. 2022, 12, 1245.
https://doi.org/10.3390/app12031245
AMA Style
Li S, Zhang H, Liu Z, Xu J, Fan G, Li W, Li Q, Hu X, Jing G.
Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) Profiling of Self Assembled Monolayer (SAM) Patterns Based on Vapor Deposition Technique. Applied Sciences. 2022; 12(3):1245.
https://doi.org/10.3390/app12031245
Chicago/Turabian Style
Li, Shi, Hongru Zhang, Zheng Liu, Junquan Xu, Guofang Fan, Wei Li, Qi Li, Xiaodong Hu, and Gaoshan Jing.
2022. "Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) Profiling of Self Assembled Monolayer (SAM) Patterns Based on Vapor Deposition Technique" Applied Sciences 12, no. 3: 1245.
https://doi.org/10.3390/app12031245
APA Style
Li, S., Zhang, H., Liu, Z., Xu, J., Fan, G., Li, W., Li, Q., Hu, X., & Jing, G.
(2022). Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) Profiling of Self Assembled Monolayer (SAM) Patterns Based on Vapor Deposition Technique. Applied Sciences, 12(3), 1245.
https://doi.org/10.3390/app12031245
