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Journal: Appl. Sci., 2022
Volume: 12
Number: 11979
Article:
Imaging the Permittivity of Thin Film Materials by Using Scanning Capacitance Microscopy
Authors:
by
Yongzhen Luo, Xidong Ding, Tianci Chen, Guocong Lin, Tao Su and Dihu Chen
Link:
https://www.mdpi.com/2076-3417/12/23/11979
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