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Journal: Appl. Sci., 2022
Volume: 12
Number: 834

Article: A Two-Stage Industrial Defect Detection Framework Based on Improved-YOLOv5 and Optimized-Inception-ResnetV2 Models
Authors: by Zhuang Li, Xincheng Tian, Xin Liu, Yan Liu and Xiaorui Shi
Link: https://www.mdpi.com/2076-3417/12/2/834

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