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        Journal: Appl. Sci., 2022
        Volume: 12 
                	Number: 9049 
                
        
        Article:
        A Theoretical Method for Removal of Gravity-Induced Effects in Silicon Wafer Geometry Measurements 
        Authors: 
       	by
                    Juan M. Trujillo-Sevilla, Jan Gaudestad and José M. RodrÃguez-Ramos        
        Link:
        https://www.mdpi.com/2076-3417/12/18/9049
        
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