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Journal: Appl. Sci., 2022
Volume: 12
Number: 5652
Article:
An Easy Technique for Focus Characterization and Optimization of XUV and Soft X-ray Pulses
Authors:
by
Alexander A. Muschet, Aitor De Andres, N. Smijesh and Laszlo Veisz
Link:
https://www.mdpi.com/2076-3417/12/11/5652
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